Año: 2015
Journal Impact Factor (JIF): 0.9740
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 158/257 | Q3 | T2 | D7 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | SCIE | 195/271 | Q3 | T3 | D8 |
PHYSICS, APPLIED | SCIE | 111/145 | Q4 | T3 | D8 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 69/83 | Q4 | T3 | D9 |
Año: 2017
Journal Citation Indicator (JCI): 0,330
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 222/306 | Q3 | T3 | D8 | 27,61 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | 224/343 | Q3 | T2 | D7 | 34,84 |
NANOSCIENCE & NANOTECHNOLOGY | 81/116 | Q3 | T3 | D7 | 30,60 |
PHYSICS, APPLIED | 119/165 | Q3 | T3 | D8 | 28,18 |
Año:
2015
CiteScore:
1,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 279/660 | Q2 | T2 | D5 |
Condensed Matter Physics | 217/401 | Q3 | T2 | D6 |
Electronic, Optical and Magnetic Materials | 117/213 | Q3 | T2 | D6 |
Hardware and Architecture | 82/141 | Q3 | T2 | D6 |
SJR año:
2015
Factor de Impacto:
0,386
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 246/677 | Q2 | T2 | D4 |
Hardware and Architecture | 59/144 | Q2 | T2 | D5 |
Condensed Matter Physics | 238/415 | Q3 | T2 | D6 |
Electronic, Optical and Magnetic Materials | 110/217 | Q3 | T2 | D6 |
Nanoscience and Nanotechnology | 53/91 | Q3 | T2 | D6 |
Agencia | Código de Proyecto |
---|---|
Spanish Ministry of Science and Innovation | TEC2011-29045-C04-02; ISILAB |
# | Autor | Afiliación |
---|---|---|
1 | Escuela Superior de Ingeniería (Spain) | |
2 | Aracil, Carmen | Escuela Superior de Ingeniería (Spain) |
3 | Quero, José M. | Escuela Superior de Ingeniería (Spain) |
4 | Gutiérrez, Manuel | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
5 | Jiménez, Cecilia | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
6 | Giménez, Pablo | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |