Año: 2015
Journal Impact Factor (JIF): 1.2770
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 128/257 | Q2 | T2 | D5 |
OPTICS | SCIE | 55/90 | Q3 | T2 | D7 |
PHYSICS, APPLIED | SCIE | 91/145 | Q3 | T2 | D7 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 64/83 | Q4 | T3 | D8 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2015
CiteScore:
2,700
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 191/660 | Q2 | T1 | D3 |
Surfaces, Coatings and Films | 30/105 | Q2 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 62/159 | Q2 | T2 | D4 |
Condensed Matter Physics | 155/401 | Q2 | T2 | D4 |
Electronic, Optical and Magnetic Materials | 80/213 | Q2 | T2 | D4 |
SJR año:
2015
Factor de Impacto:
0,507
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 204/677 | Q2 | T1 | D4 |
Surfaces, Coatings and Films | 40/117 | Q2 | T2 | D4 |
Atomic and Molecular Physics, and Optics | 74/171 | Q2 | T2 | D5 |
Condensed Matter Physics | 187/415 | Q2 | T2 | D5 |
Electronic, Optical and Magnetic Materials | 92/217 | Q2 | T2 | D5 |
Nanoscience and Nanotechnology | 46/91 | Q2 | T2 | D6 |
Agencia | Código de Proyecto |
---|---|
Spanish Ministry of Science and Innovation, ISILAB | TEC2011-29045-004-02 |
# | Autor | Afiliación |
---|---|---|
1 | Universidad de Sevilla (Spain) | |
2 | Perdigones, Francisco | Universidad de Sevilla (Spain) |
3 | Moreno, José Miguel | Universidad de Sevilla (Spain) |
4 | Luque, Antonio | Universidad de Sevilla (Spain) |
5 | Quero, José Manuel | Universidad de Sevilla (Spain) |