Año: 2009
Journal Impact Factor (JIF): 1.9970
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 43/246 | Q1 | T1 | D2 |
INSTRUMENTS & INSTRUMENTATION | SCIE | 9/58 | Q1 | T1 | D2 |
MECHANICS | SCIE | 13/123 | Q1 | T1 | D2 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | SCIE | 50/214 | Q1 | T1 | D3 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 27/59 | Q2 | T2 | D5 |
Año: 2017
Journal Citation Indicator (JCI): 0,520
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 170/306 | Q3 | T2 | D6 | 44,61 |
INSTRUMENTS & INSTRUMENTATION | 40/69 | Q3 | T2 | D6 | 42,75 |
NANOSCIENCE & NANOTECHNOLOGY | 63/116 | Q3 | T2 | D6 | 46,12 |
PHYSICS, APPLIED | 78/165 | Q2 | T2 | D5 | 53,03 |
Año:
2011
CiteScore:
4,000
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Mechanical Engineering | 38/487 | Q1 | T1 | D1 |
Mechanics of Materials | 26/296 | Q1 | T1 | D1 |
Electrical and Electronic Engineering | 81/589 | Q1 | T1 | D2 |
Electronic, Optical and Magnetic Materials | 32/183 | Q1 | T1 | D2 |
SJR año:
2009
Factor de Impacto:
1,144
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 70/598 | Q1 | T1 | D2 |
Electronic, Optical and Magnetic Materials | 32/188 | Q1 | T1 | D2 |
Mechanical Engineering | 59/567 | Q1 | T1 | D2 |
Mechanics of Materials | 47/312 | Q1 | T1 | D2 |
Nanoscience and Nanotechnology | 24/80 | Q2 | T1 | D3 |
# | Autor | Afiliación |
---|---|---|
1 | Universidad de Sevilla (Spain) | |
2 | Perdigones, F. | Universidad de Sevilla (Spain) |
3 | Estevé, J. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
4 | Montserrat, J. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
5 | Gãn-Calvo, A. | Universidad de Sevilla (Spain) |
6 | Quero, J. M. | Universidad de Sevilla (Spain) |