Año: 1997
Journal Impact Factor (JIF): 0.7910
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 46/193 | Q1 | T1 | D3 |
OPTICS | SCIE | 17/45 | Q2 | T2 | D4 |
PHYSICS, APPLIED | SCIE | 35/62 | Q3 | T2 | D6 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2011
CiteScore:
2,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 146/589 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 21/91 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 43/141 | Q2 | T1 | D4 |
Condensed Matter Physics | 120/383 | Q2 | T1 | D4 |
Electronic, Optical and Magnetic Materials | 56/183 | Q2 | T1 | D4 |
SJR año:
1999
Factor de Impacto:
0,595
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 85/418 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 32/94 | Q2 | T2 | D4 |
Atomic and Molecular Physics, and Optics | 48/111 | Q2 | T2 | D5 |
Condensed Matter Physics | 140/311 | Q2 | T2 | D5 |
Electronic, Optical and Magnetic Materials | 57/137 | Q2 | T2 | D5 |
Nanoscience and Nanotechnology | 9/18 | Q2 | T2 | D5 |
# | Autor | Afiliación |
---|---|---|
1 | Sin datos () | |
2 | Garry, G | Sin datos () |
3 | Bisaro, R | Sin datos () |
4 | Olivier, J | Sin datos () |
5 | Lopez, JG | Sorbonne Universite (France) |
6 | Urlacher, C | Université Claude Bernard Lyon 1 (France) |