Año: 2007
Journal Impact Factor (JIF): 1.5030
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 50/227 | Q1 | T1 | D3 |
OPTICS | SCIE | 20/64 | Q2 | T1 | D4 |
PHYSICS, APPLIED | SCIE | 38/94 | Q2 | T2 | D4 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 22/47 | Q2 | T2 | D5 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2011
CiteScore:
2,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 146/589 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 21/91 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 43/141 | Q2 | T1 | D4 |
Condensed Matter Physics | 120/383 | Q2 | T1 | D4 |
Electronic, Optical and Magnetic Materials | 56/183 | Q2 | T1 | D4 |
SJR año:
2007
Factor de Impacto:
1,045
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 79/529 | Q1 | T1 | D2 |
Surfaces, Coatings and Films | 19/104 | Q1 | T1 | D2 |
Atomic and Molecular Physics, and Optics | 28/130 | Q1 | T1 | D3 |
Condensed Matter Physics | 95/377 | Q1 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 38/158 | Q1 | T1 | D3 |
Nanoscience and Nanotechnology | 22/51 | Q2 | T2 | D5 |
# | Autor | Afiliación |
---|---|---|
1 | New Mexico State University (United States) | |
2 | Durbha, C. | New Mexico State University (United States) |
3 | Ducoudray-Acevedo, G. O. | New Mexico State University (United States) |
4 | Carvajal, Ramon G. | Universidad de Sevilla (Spain) |
5 | Lopez-Martin, A. | Universidad Pública de Navarra (Spain) |