Año: 2014
Journal Impact Factor (JIF): 0.8360
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 161/249 | Q3 | T2 | D7 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 72/80 | Q4 | T3 | D9 |
Año: 2017
Journal Citation Indicator (JCI): 0,370
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 214/306 | Q3 | T3 | D7 | 30,23 |
NANOSCIENCE & NANOTECHNOLOGY | 76/116 | Q3 | T2 | D7 | 34,91 |
Año:
2023
CiteScore:
4,000
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Atomic and Molecular Physics, and Optics | 101/224 | Q2 | T2 | D5 |
Condensed Matter Physics | 181/434 | Q2 | T2 | D5 |
Electrical and Electronic Engineering | 332/797 | Q2 | T2 | D5 |
Electronic, Optical and Magnetic Materials | 133/284 | Q2 | T2 | D5 |
Surfaces, Coatings and Films | 61/132 | Q2 | T2 | D5 |
SJR año:
2023
Factor de Impacto:
0,390
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Atomic and Molecular Physics, and Optics | 117/210 | Q3 | T2 | D6 |
Condensed Matter Physics | 226/431 | Q3 | T2 | D6 |
Electrical and Electronic Engineering | 367/723 | Q3 | T2 | D6 |
Electronic, Optical and Magnetic Materials | 152/262 | Q3 | T2 | D6 |
Surfaces, Coatings and Films | 70/134 | Q3 | T2 | D6 |
Nanoscience and Nanotechnology | 50/77 | Q3 | T2 | D7 |
Agencia | Código de Proyecto |
---|---|
Spanish Direccion General de Investigacion | TEC2010-21563-C02/MIC |
# | Autor | Afiliación |
---|---|---|
1 | Universidad Pública de Navarra (Spain) | |
2 | Lopez-Martin, Antonio J. | Universidad Pública de Navarra (Spain) |
3 | Carvajal, Ramon G. | Universidad de Sevilla (Spain) |
4 | Ramirez-Angulo, Jaime | New Mexico State University (United States) |