Año: 2010
Journal Impact Factor (JIF): 1.5750
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 66/247 | Q2 | T1 | D3 |
OPTICS | SCIE | 30/78 | Q2 | T2 | D4 |
PHYSICS, APPLIED | SCIE | 50/118 | Q2 | T2 | D5 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 42/64 | Q3 | T2 | D7 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2011
CiteScore:
2,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 146/589 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 21/91 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 43/141 | Q2 | T1 | D4 |
Condensed Matter Physics | 120/383 | Q2 | T1 | D4 |
Electronic, Optical and Magnetic Materials | 56/183 | Q2 | T1 | D4 |
SJR año:
2010
Factor de Impacto:
0,934
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 83/613 | Q1 | T1 | D2 |
Surfaces, Coatings and Films | 20/109 | Q1 | T1 | D2 |
Atomic and Molecular Physics, and Optics | 34/153 | Q1 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 44/187 | Q1 | T1 | D3 |
Condensed Matter Physics | 111/405 | Q2 | T1 | D3 |
Nanoscience and Nanotechnology | 36/88 | Q2 | T2 | D5 |
# | Autor | Afiliación |
---|---|---|
1 | Universidad de Sevilla (Spain) | |
2 | Luque, A. | Universidad de Sevilla (Spain) |
3 | Quero, J. M. | Universidad de Sevilla (Spain) |