Año: 2012
Journal Impact Factor (JIF): 1.2240
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 109/243 | Q2 | T2 | D5 |
OPTICS | SCIE | 38/80 | Q2 | T2 | D5 |
PHYSICS, APPLIED | SCIE | 72/128 | Q3 | T2 | D6 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 47/69 | Q3 | T3 | D7 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2012
CiteScore:
3,000
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 146/615 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 19/93 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 41/145 | Q2 | T1 | D3 |
Condensed Matter Physics | 116/387 | Q2 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 55/193 | Q2 | T1 | D3 |
SJR año:
2012
Factor de Impacto:
0,737
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 137/643 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 25/104 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 48/163 | Q2 | T1 | D3 |
Condensed Matter Physics | 136/411 | Q2 | T1 | D4 |
Electronic, Optical and Magnetic Materials | 63/197 | Q2 | T1 | D4 |
Nanoscience and Nanotechnology | 41/93 | Q2 | T2 | D5 |
# | Autor | Afiliación |
---|---|---|
1 | University of Cyprus (Cyprus) | |
2 | Ramos, Antonio | Universidad de Sevilla (Spain) |
3 | Georghiou, George E. | University of Cyprus (Cyprus) |