Año: 2010
Journal Impact Factor (JIF): 1.4720
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
MATERIALS SCIENCE, MULTIDISCIPLINARY | SCIE | 87/225 | Q2 | T2 | D4 |
PHYSICS, APPLIED | SCIE | 54/118 | Q2 | T2 | D5 |
PHYSICS, CONDENSED MATTER | SCIE | 31/68 | Q2 | T2 | D5 |
Año: 2017
Journal Citation Indicator (JCI): 0,460
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
MATERIALS SCIENCE, MULTIDISCIPLINARY | 185/343 | Q3 | T2 | D6 | 46,21 |
PHYSICS, APPLIED | 95/165 | Q3 | T2 | D6 | 42,73 |
PHYSICS, CONDENSED MATTER | 41/74 | Q3 | T2 | D6 | 45,27 |
Año:
2011
CiteScore:
2,700
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Materials Chemistry | 57/233 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 23/91 | Q1 | T1 | D3 |
Electrical and Electronic Engineering | 151/589 | Q2 | T1 | D3 |
Condensed Matter Physics | 127/383 | Q2 | T1 | D4 |
Electronic, Optical and Magnetic Materials | 59/183 | Q2 | T1 | D4 |
Surfaces and Interfaces | 17/49 | Q2 | T2 | D4 |
SJR año:
2010
Factor de Impacto:
0,871
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 95/613 | Q1 | T1 | D2 |
Materials Chemistry | 51/246 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 24/109 | Q1 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 50/187 | Q2 | T1 | D3 |
Condensed Matter Physics | 126/405 | Q2 | T1 | D4 |
Surfaces and Interfaces | 21/54 | Q2 | T2 | D4 |
# | Autor | Afiliación |
---|---|---|
1 | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) | |
2 | Ferrer, F. J. | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
3 | Vignaud, D. | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
4 | Godey, S. | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
5 | Wallart, X. | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |