Año: 2009
Journal Impact Factor (JIF): 1.2530
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 93/246 | Q2 | T2 | D4 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | SCIE | 98/214 | Q2 | T2 | D5 |
PHYSICS, CONDENSED MATTER | SCIE | 33/66 | Q2 | T2 | D5 |
Año: 2017
Journal Citation Indicator (JCI): 0,580
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 156/306 | Q3 | T2 | D6 | 49,18 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | 147/343 | Q2 | T2 | D5 | 57,29 |
PHYSICS, CONDENSED MATTER | 28/74 | Q2 | T2 | D4 | 62,84 |
Año:
2011
CiteScore:
2,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 140/589 | Q1 | T1 | D3 |
Materials Chemistry | 55/233 | Q1 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 52/183 | Q2 | T1 | D3 |
Condensed Matter Physics | 115/383 | Q2 | T1 | D4 |
SJR año:
2009
Factor de Impacto:
0,865
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 100/598 | Q1 | T1 | D2 |
Materials Chemistry | 54/248 | Q1 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 52/188 | Q2 | T1 | D3 |
Condensed Matter Physics | 128/401 | Q2 | T1 | D4 |
Agencia | Código de Proyecto |
---|---|
ANR (project Xp-Graphene) | - |
European Union (FEDER) | - |
Nord-Pas de Calais regional council | - |
# | Autor | Afiliación |
---|---|---|
1 | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) | |
2 | Moreau, Eleonore | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
3 | Vignaud, Dominique | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
4 | Godey, Sylvie | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |
5 | Wallart, Xavier | IEMN Institut d'Electronique de Microélectronique et de Nanotechnologie (France) |