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Publicaciones en la fuente JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Tipo Año Título Fuente
Artículo2011Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope SignaturesJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2011Analog Sinewave Signal Generators for Mixed-Signal Built-in Test ApplicationsJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2010A BIST Solution for Frequency Domain Characterization of Analog CircuitsJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Editorial2005Comments by the chairmenJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2005Sine-wave signal characterization using square-wave and Sigma Delta-modulation: Application to mixed-signal BISTJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2001Efficient realization of a threshold voter for self-purging redundancyJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2001New BIST schemes for structural testing of pipelined analog to digital convertersJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo1999Self-timed boundary-scan cells for multi-chip module testJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Letter1995Constrained state assignment of easily testable fsmsJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo1993Improving the testability of switched-capacitor filtersJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS