Año: 2008
Journal Impact Factor (JIF): 0.8590
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 132/229 | Q3 | T2 | D6 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 46/52 | Q4 | T3 | D9 |
Año: 2017
Journal Citation Indicator (JCI): 0,370
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 214/306 | Q3 | T3 | D7 | 30,23 |
NANOSCIENCE & NANOTECHNOLOGY | 76/116 | Q3 | T2 | D7 | 34,91 |
Año:
2023
CiteScore:
4,000
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Atomic and Molecular Physics, and Optics | 101/224 | Q2 | T2 | D5 |
Condensed Matter Physics | 181/434 | Q2 | T2 | D5 |
Electrical and Electronic Engineering | 332/797 | Q2 | T2 | D5 |
Electronic, Optical and Magnetic Materials | 133/284 | Q2 | T2 | D5 |
Surfaces, Coatings and Films | 61/132 | Q2 | T2 | D5 |
SJR año:
2023
Factor de Impacto:
0,390
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Atomic and Molecular Physics, and Optics | 117/210 | Q3 | T2 | D6 |
Condensed Matter Physics | 226/431 | Q3 | T2 | D6 |
Electrical and Electronic Engineering | 367/723 | Q3 | T2 | D6 |
Electronic, Optical and Magnetic Materials | 152/262 | Q3 | T2 | D6 |
Surfaces, Coatings and Films | 70/134 | Q3 | T2 | D6 |
Nanoscience and Nanotechnology | 50/77 | Q3 | T2 | D7 |
# | Autor | Afiliación |
---|---|---|
1 | Tortosa, Ramón | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
2 | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) | |
3 | Fernández, Francisco V. | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
4 | Rodríguez-Vázquez, Angel | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |