Año: 2018
Journal Impact Factor (JIF): 1.6540
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
PHYSICS, APPLIED | SCIE | 88/148 | Q3 | T2 | D6 |
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 165/266 | Q3 | T2 | D7 |
OPTICS | SCIE | 60/95 | Q3 | T2 | D7 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 72/94 | Q4 | T3 | D8 |
Año: 2018
Journal Citation Indicator (JCI): 0,530
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 167/312 | Q3 | T2 | D6 | 46,64 |
NANOSCIENCE & NANOTECHNOLOGY | 63/122 | Q3 | T2 | D6 | 48,77 |
OPTICS | 58/108 | Q3 | T2 | D6 | 46,76 |
PHYSICS, APPLIED | 77/169 | Q2 | T2 | D5 | 54,73 |
Año:
2018
CiteScore:
4,200
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Surfaces, Coatings and Films | 23/118 | Q1 | T1 | D2 |
Electrical and Electronic Engineering | 150/669 | Q1 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 51/176 | Q2 | T1 | D3 |
Condensed Matter Physics | 106/398 | Q2 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 62/227 | Q2 | T1 | D3 |
SJR año:
2018
Factor de Impacto:
0,561
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 173/714 | Q2 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 71/237 | Q2 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 63/190 | Q2 | T1 | D4 |
Surfaces, Coatings and Films | 39/128 | Q2 | T1 | D4 |
Condensed Matter Physics | 161/426 | Q2 | T2 | D4 |
Nanoscience and Nanotechnology | 36/88 | Q2 | T2 | D5 |
Agencia | Código de Proyecto |
---|---|
EU H2020 grants | 644096 "ECOMODE"; 687299 "NeuRAM3" |
European Regional Development Fund | - |
International Consortium of Nanotechnology of the Lloyd\'s Register Foundation | G0086 |
Ministry of Economy and Competitiveness | TEC2013-45638-C3-3-R; TEC2015-63884-C2-1-P; TEC2016-75151-C3-3-R |
# | Autor | Afiliación |
---|---|---|
1 | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) | |
2 | Camuñas-Mesa, L. A. | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
3 | Vianello, E. | CEA LETI (France) |
4 | Periniolla, L. | CEA LETI (France) |
5 | Reita, C. | CEA LETI (France) |
6 | de la Rosa, J. M. | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
7 | Serrano-Gotarredona, T. | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
8 | Linares-Barranco, B. | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |