Año: 2016
Journal Impact Factor (JIF): 0.7540
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 213/262 | Q4 | T3 | D9 |
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY | SCIE | 23/26 | Q4 | T3 | D9 |
OPTICS | SCIE | 76/92 | Q4 | T3 | D9 |
Año: 2017
Journal Citation Indicator (JCI): 0,280
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 233/306 | Q4 | T3 | D8 | 24,02 |
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY | 26/30 | Q4 | T3 | D9 | 15,00 |
OPTICS | 89/106 | Q4 | T3 | D9 | 16,51 |
Año:
2016
CiteScore:
1,600
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 327/654 | Q2 | T2 | D5 |
Computer Science Applications | 316/533 | Q3 | T2 | D6 |
Atomic and Molecular Physics, and Optics | 102/163 | Q3 | T2 | D7 |
SJR año:
2016
Factor de Impacto:
0,269
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 327/679 | Q3 | T2 | D5 |
Computer Science Applications | 343/617 | Q3 | T2 | D6 |
Atomic and Molecular Physics, and Optics | 119/176 | Q3 | T3 | D7 |
# | Autor | Afiliación |
---|---|---|
1 | Universidad de Sevilla (Spain) | |
2 | Berry, François | Université Clermont Auvergne (France) |
3 | Micheloni, Christian | Università degli Studi di Udine (Italy) |