Año: 2014
Journal Impact Factor (JIF): 1.1970
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 129/249 | Q3 | T2 | D6 |
OPTICS | SCIE | 54/87 | Q3 | T2 | D7 |
PHYSICS, APPLIED | SCIE | 94/144 | Q3 | T2 | D7 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 62/80 | Q4 | T3 | D8 |
Año: 2017
Journal Citation Indicator (JCI): 0,540
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 165/306 | Q3 | T2 | D6 | 46,24 |
NANOSCIENCE & NANOTECHNOLOGY | 60/116 | Q3 | T2 | D6 | 48,71 |
OPTICS | 54/106 | Q3 | T2 | D6 | 49,53 |
PHYSICS, APPLIED | 73/165 | Q2 | T2 | D5 | 56,06 |
Año:
2014
CiteScore:
2,900
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 157/651 | Q1 | T1 | D3 |
Surfaces, Coatings and Films | 29/101 | Q2 | T1 | D3 |
Atomic and Molecular Physics, and Optics | 51/157 | Q2 | T1 | D4 |
Condensed Matter Physics | 136/395 | Q2 | T2 | D4 |
Electronic, Optical and Magnetic Materials | 71/207 | Q2 | T2 | D4 |
SJR año:
2014
Factor de Impacto:
0,586
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 179/665 | Q2 | T1 | D3 |
Surfaces, Coatings and Films | 32/112 | Q2 | T1 | D3 |
Electronic, Optical and Magnetic Materials | 80/208 | Q2 | T2 | D4 |
Atomic and Molecular Physics, and Optics | 70/170 | Q2 | T2 | D5 |
Condensed Matter Physics | 166/411 | Q2 | T2 | D5 |
Nanoscience and Nanotechnology | 44/91 | Q2 | T2 | D5 |
Agencia | Código de Proyecto |
---|---|
Swiss federal program Nano-Tera (nanotera.ch) through "NEXRAY" | - |
# | Autor | Afiliación |
---|---|---|
1 | Centre Suisse d'Electronique et de Microtechnique SA (Switzerland) | |
2 | Longtin, Rémi | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
3 | Giudice, Sandra | Centre Suisse d'Electronique et Microtechnique SA (Switzerland) |
4 | Jose-James, Rony | Centre Suisse d'Electronique et Microtechnique SA (Switzerland) |
5 | Niedermann, Philippe | Centre Suisse d'Electronique et de Microtechnique SA (Switzerland) |
6 | Neels, Antonia | Centre Suisse d'Electronique et de Microtechnique SA (Switzerland) |
7 | Kaufmann, Rolf | Centre Suisse d'Electronique et de Microtechnique SA (Switzerland) |
8 | Sanchez-Valencia, Juan Ramon | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
9 | Elsener, Hans Rudolf | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
10 | Gröning, Oliver | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
11 | Leinenbach, Christian | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
12 | Gröning, Pierangelo | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |
13 | Dommann, Alex | Empa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland) |