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Publicaciones en la fuente JOURNAL OF APPLIED CRYSTALLOGRAPHY

Tipo Año Título Fuente
Artículo2019Nanometre-sized droplets from a gas dynamic virtual nozzleJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo2017Precision and accuracy of stress measurement with a portable X-ray machine using an area detectorJOURNAL OF APPLIED CRYSTALLOGRAPHY
Editorial2013The prolific polytypism of silicon carbideJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo2011Structural elucidation of beta-(Y,Sc)(2)Si2O7: combined use of Y-89 MAS NMR and powder diffractionJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo2006Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaksJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo2004Structure determination of nitrato-kappa O-bis[2-(2-pyridyl-kappa N)amino-5,6-dihydro-4H-1,3-thiazine-kappa N]copper(II) nitrate via molecular modelling coupled with X-ray powder diffractometryJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo2000Deconvolution of X-ray diffraction profiles by using series expansionJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo1999A Gaussian-Hermite polynomials function for X-ray diffraction profile fittingJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo1997The use of the pseudo-Voigt function in the variance method of X-ray line-broadening analysisJOURNAL OF APPLIED CRYSTALLOGRAPHY
Corrección1997The use of the pseudo-Voigt function in the variance method of x-ray line-broadening analysis. (vol 30, pg 427, 1997)JOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo1995An improved method for the normalization of the scattered intensity and accurate determination of the macroscopic density of noncrystalline materialsJOURNAL OF APPLIED CRYSTALLOGRAPHY
Artículo1994X-ray berg-barrett topography of the deformation substructure of stabilized zirconium-oxide single-crystals deformed at 1673-kJOURNAL OF APPLIED CRYSTALLOGRAPHY