Artículo | 2024 |
Lynx: An Efficient and Flexible Communication Schema for On-Chip and Off-Chip Applications in Distributed Static Industrial Networks
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IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS |
Artículo | 2024 |
Protocol-aware approach for mitigating radiation-induced errors in free-space optical downlinks
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Journal of Optical Communications and Networking |
Artículo | 2022 |
A cross-disciplinary outlook of directions and challenges in industrial electronics
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IEEE OPEN JOURNAL OF THE INDUSTRIAL ELECTRONICS SOCIETY |
Ponencia | 2021 |
A cross-disciplinary view of industrial electronics: change, chance, and challenge
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IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society |
Artículo | 2020 |
A virtual device for simulation-based fault injection
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ELECTRONICS |
Artículo | 2020 |
Efficient FPSoc prototyping of FCS-MPC for three-phase voltage source inverters
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ENERGIES |
Artículo | 2020 |
SW-VHDL co-verification environment using open source tools
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ELECTRONICS |
Artículo | 2019 |
Fine-Grain Circuit Hardening Through VHDL Datatype Substitution
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ELECTRONICS |
Ponencia | 2017 |
Contrast of a HDL model and COTS version of a microprocessor for Soft-Error Testing
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2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017) |
Ponencia | 2017 |
SEU Fault Classification by Fault Injection for an FPGA in the Space Instrument SOPHI
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2017 NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS (AHS) |
Capítulo | 2015 |
A fault injection technique oriented to SRAM-FPGAs
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FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design |
Ponencia | 2015 |
Comparative Study of DTC and RFOC Methods for the Open-Phase Fault Operation of a 5-Phase Induction Motor Drive
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IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society |
Ponencia | 2015 |
FPGA-based mimicking of cryptographic device hacking through fault injection attacks
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2015 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT) |
Ponencia | 2014 |
Early Assessment of SEU Sensitivity through Untestable Fault Identification
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PROCEEDINGS OF THE 2014 IEEE 20TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) |
Ponencia | 2014 |
On the modelling of SEU effects on spread spectrum wireless systems
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2nd IEEE International Conference on Wireless for Space and Extreme Environments, WiSEE 2014 |
Artículo | 2014 |
On the Structural Robustness Assessment of Wireless Communication Systems for Intra-Satellite Applications
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Ponencia | 2014 |
Two complementary approaches for studying the effects of SEUs on HDL-based designs
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PROCEEDINGS OF THE 2014 IEEE 20TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) |
Artículo | 2013 |
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment
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IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS |
Ponencia | 2013 |
Implementation of a Machine Vision System for Real-Time Traffic Sign Recognition on FPGA
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39TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2013) |
Artículo | 2013 |
Metrics for the Measurement of the Quality of Stimuli in Radiation Testing Using Fast Hardware Emulation
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Artículo | 2012 |
Compiler-Directed Soft Error Mitigation for Embedded Systems
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IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING |
Ponencia | 2012 |
Speed Control of Five-Phase Induction Motor Drives with an Open Phase Fault Condition and Predictive Current Control Methods
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38TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2012) |
Artículo | 2011 |
A Novel Co-Design Approach for Soft Errors Mitigation in Embedded Systems
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Artículo | 2011 |
Coping With the Obsolescence of Safety- or Mission-Critical Embedded Systems Using FPGAs
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS |
Ponencia | 2011 |
Fault-Tolerant Current Predictive Control of Five-Phase Induction Motor Drives with an Open Phase
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IECON 2011: 37TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY |
Ponencia | 2011 |
FTUNSHADES2: A novel platform for early evaluation of robustness against SEE
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |
Ponencia | 2011 |
On the definition of real conditions for a fault injection experiment on embedded systems
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |
Ponencia | 2011 |
Real time SEU detection and diagnosis for safety or mission-critical ICs using HASH library-based fault dictionaries
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |
Artículo | 2011 |
Soft core based embedded systems in critical aerospace applications
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JOURNAL OF SYSTEMS ARCHITECTURE |
Ponencia | 2010 |
A compiler-based infrastructure for fault-tolerant co-design
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Proceedings of the 13th International Workshop on Software and Compilers for Embedded Systems, SCOPES 2010 |
Ponencia | 2010 |
Advanced Speeding-up Techniques for SEU Sensitivity Assessment
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IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE 2010) |
Ponencia | 2010 |
Application-Driven Co-design of Fault-Tolerant Industrial Systems
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IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE 2010) |
Ponencia | 2010 |
Rapid prototyping of radiation-tolerant embedded systems on FPGA
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Proceedings - 2010 International Conference on Field Programmable Logic and Applications, FPL 2010 |
Artículo | 2010 |
TCAD Simulations on CMOS Propagation Induced Pulse Broadening Effect: Dependence Analysis on the Threshold Voltage
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Artículo | 2009 |
Fault Injection Analysis of Bidirectional Signals
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Artículo | 2009 |
Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors
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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
Artículo | 2009 |
Pulsed Laser SEU Cross Section Measurement Using Coincidence Detectors
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Ponencia | 2009 |
Realization of a Flexible Platform for Fruit Inspection and Classification Applications with Emphasis in Rapid Prototyping and Development
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IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6 |
Ponencia | 2009 |
TCAD simulations on CMOS propagation induced pulse broadening effect: Dependence analysis on the NMOS VT
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |
Ponencia | 2008 |
A complete emulation system for Single Event Effects analysis
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2008 4TH SOUTHERN CONFERENCE ON PROGRAMMABLE LOGIC, PROCEEDINGS |
Ponencia | 2008 |
A non-invasive system for the measurement of the robustness of microprocessor-type architectures against radiation-induced soft errors
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2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 |
Ponencia | 2008 |
FT-UNSHADES-uP: A platform for the analysis and optimal hardening of embedded systems in radiation environments.
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2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5 |
Ponencia | 2008 |
On the design of tunable fault tolerant circuits on SRAM-based FPGAs for safety critical applications
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Design Automation and Test in Europe Conference and Exhibition |
Ponencia | 2008 |
Pulsed Laser SEU Cross-Section measurement using coincidence detectors
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |
Ponencia | 2007 |
Radiation environment emulation for VLSI designs: A low cost platform based on Xilinx FPGA's
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2007 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, PROCEEDINGS, VOLS 1-8 |
Artículo | 2007 |
Selective protection analysis using a SEU emulator: testing protocol and case study over the leon2 processor
|
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
Ponencia | 2007 |
The experience of starting-up a radiation test at the 18MeV cyclotron in the spanish national accelerators center
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Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS |