Año: 2023
Journal Impact Factor (JIF): 2.10
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 192/352 | Q3 | T2 | D6 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | SCIE | 286/438 | Q3 | T2 | D7 |
PHYSICS, APPLIED | SCIE | 109/179 | Q3 | T2 | D7 |
NANOSCIENCE & NANOTECHNOLOGY | SCIE | 105/140 | Q3 | T3 | D8 |
Año: 2023
Journal Citation Indicator (JCI): 0,470
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | 200/354 | Q3 | T2 | D6 | 43,64 |
MATERIALS SCIENCE, MULTIDISCIPLINARY | 255/438 | Q3 | T2 | D6 | 41,90 |
NANOSCIENCE & NANOTECHNOLOGY | 82/140 | Q3 | T2 | D6 | 41,79 |
PHYSICS, APPLIED | 106/179 | Q3 | T2 | D6 | 41,06 |
Año:
2023
CiteScore:
4,800
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 278/797 | Q2 | T2 | D4 |
Computer Science Applications | 330/817 | Q2 | T2 | D5 |
SJR año:
2023
Factor de Impacto:
0,435
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 338/723 | Q2 | T2 | D5 |
Computer Science Applications | 441/785 | Q3 | T2 | D6 |
Nanoscience and Nanotechnology | 44/77 | Q3 | T2 | D6 |
# | Autor | Afiliación |
---|---|---|
1 | Zhang, Tingting | University of Alberta (Canada) |
2 | Tao, Qichao | University of Alberta (Canada) |
3 | Liu, Bailiang | University of Alberta (Canada) |
4 | Grimaldi, Andrea | Università degli Studi di Messina (Italy) |
5 | Raimondo, Eleonora | Università degli Studi di Messina (Italy) |
6 | Jimenez, Manuel | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
7 | Avedillo, Maria Jose | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
8 | Nunez, Juan | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
9 | Linares-Barranco, Bernabe | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
10 | Serrano-Gotarredona, Teresa | CSIC - Instituto de Microelectronica de Sevilla (IMS-CNM) (Spain) |
11 | Finocchio, Giovanni | Università degli Studi di Messina (Italy) |
12 | Han, Jie | University of Alberta (Canada) |