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Publicaciones en la fuente IEEE International Reliability Physics Symposium Proceedings

Tipo Año Título Fuente
Ponencia2023Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variabilityIEEE International Reliability Physics Symposium Proceedings
Ponencia2023Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic PathsIEEE International Reliability Physics Symposium Proceedings
Ponencia2022A smart SRAM-cell array for the experimental study of variability phenomena in CMOS technologiesIEEE International Reliability Physics Symposium Proceedings
Ponencia2019A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
Ponencia2018Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)