Año: 2008
Journal Impact Factor (JIF): 1.4960
Categoría | Edición | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|---|
COMPUTER SCIENCE, SOFTWARE ENGINEERING | SCIE | 27/86 | Q2 | T1 | D4 |
COMPUTER SCIENCE, THEORY & METHODS | SCIE | 26/84 | Q2 | T1 | D4 |
ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 72/229 | Q2 | T1 | D4 |
OPTICS | SCIE | 25/64 | Q2 | T2 | D4 |
COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE | SCIE | 42/94 | Q2 | T2 | D5 |
Año: 2017
Journal Citation Indicator (JCI): 1,060
Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
---|---|---|---|---|---|
COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE | 48/170 | Q2 | T1 | D3 | 72,06 |
COMPUTER SCIENCE, SOFTWARE ENGINEERING | 33/125 | Q2 | T1 | D3 | 74,00 |
COMPUTER SCIENCE, THEORY & METHODS | 31/132 | Q1 | T1 | D3 | 76,89 |
ENGINEERING, ELECTRICAL & ELECTRONIC | 81/306 | Q2 | T1 | D3 | 73,69 |
OPTICS | 25/106 | Q1 | T1 | D3 | 76,89 |
Año:
2011
CiteScore:
5,900
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 37/589 | Q1 | T1 | D1 |
Computer Vision and Pattern Recognition | 8/55 | Q1 | T1 | D2 |
SJR año:
2008
Factor de Impacto:
0,777
Categoría | Posición | Cuartil | Tercil | Decil |
---|---|---|---|---|
Electrical and Electronic Engineering | 118/541 | Q1 | T1 | D3 |
Computer Vision and Pattern Recognition | 15/52 | Q2 | T1 | D3 |
Signal Processing | 20/63 | Q2 | T1 | D4 |
# | Autor | Afiliación |
---|---|---|
1 | Martinez-de Dios, J. R. | Universidad de Sevilla (Spain) |
2 | Arrue, B. C. | Universidad de Sevilla (Spain) |
3 | Ollero, A. | Universidad de Sevilla (Spain) |
4 | Universidad Pablo de Olavide (Spain) | |
5 | Gómez-Rodríguez, F. | Universidad de Sevilla (Spain) |